Graphene Spectroscopy

The Society for Applied Spectroscopy (SAS) UK Regional Section and the Graphene Centre, University of Cambridge will jointly host Graphene Spectroscopy a one day meeting to be held on Tuesday 29th October 2013 at Trinity Hall in Cambridge, UK. The meeting will focus on recent advances in the characterization of graphene by spectroscopic methods.

The presentations will be by

Prof. Ping-Heng Tan, Chinese Academy of Sciences, Beijing, P.R. China, “Application of ultra-low frequency Raman spectroscopy in two-dimensional layered materials.”

Prof. Andrea Ferrari, Cambridge Graphene Centre, UK, “Title to be announced.”

Dr. Duhee Yoon, Cambridge Graphene Centre, UK, “Raman spectroscopy for characterization of strained graphene.”

Prof. Günter Hoffmann, Eindhoven University of Technology, The Netherlands, “Tip-enhanced Raman Spectroscopy (TERS) and Mapping (TERM) of graphene and related materials”.

Dr. Cinzia Casiraghi, University of Manchester, UK. "Raman spectroscopy of defective graphene: Effect of the excitation energy, type, amount of defects and applied gate voltage."

Dr. Michael Johnston, University of Oxford, UK. “Terahertz spectroscopy of graphene.”

Prof. Giulio Cerullo, Politecnico di Milano, Italy. "Ultrafast electron-electron scattering in graphene.”

Prof. Euan Hendry, University of Exeter, UK. "Ultrafast optical measurements of graphene."

Dr. Rahul Raveendran-Nair, University of Manchester, UK, “Characterisation of graphene and its chemical derivatives by different spectroscopic techniques.

The meeting has been co-organised by Francesco Bonaccorso (on behalf of the Cambridge Graphene Centre) and John Chalmers (on behalf of the SAS UK Regional Section).