Trace Element Analysis: Time and Cost Savings with TXRF

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Webinar

  • Date: Jan 21, 2009 - 15:00 - 16:00 (local time)
  • Categories: Atomic
thumbnail image: Trace Element Analysis: Time and Cost Savings with TXRF

Bruker AXS

 

You are invited to our complimentary webinar:

Trace Element Analysis:
Time and Cost Savings with TXRF
 

S2 PICOFOX TXRF spectrometer

S2 PICOFOX TXRF spectrometer

Methods for trace element analysis, like atomic absorption spectroscopy (AAS) or inductively-coupled plasma spectroscopy (ICP), are well established, but are often limited by sample quantity, the necessity for sample digestion, lengthy sample preparation and complex matrix effects.

Total reflection X-ray fluorescence (TXRF) spectrometry is an analytical method that is very sensitive to ultra-low concentrations of elements in even minute sample amounts. It is capable of analyzing nanogram sample amounts with element concentrations ranging from 0.1 ppb to 100%. The S2 PICOFOX benchtop TXRF spectrometer is compact, portable and needs no expensive consumables. Learn how TXRF can save you time by performing trace element analysis of any sample type, without the wait for sample preparation.

During this one-hour interactive webinar, we will present the basics of the TXRF method. We will compare TXRF with AAS and ICP, and explore TXRF's many benefits. Examples of TXRF applications in the analysis of pharmaceutical and clinical samples will be highlighted based on audience questions and input.



Your presenters

Hagen Stosnach

Hagen Stosnach
Application Scientist
Bruker AXS Microanalysis GmbH

Armin Gross

Armin Gross
Global Product Manager
Bruker AXS Microanalysis GmbH

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