Is your AA overworked?
Is high specification ICP overkill?
Discover the solution.

This webinar was recorded on March 29, 2011
and is now available on-demand.

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Are you pushing your old AA to the limits and looking for a simple, low cost solution to analyze more elements with higher throughput capability? Do you have new trace elemental analysis requirements? If so, this webinar informs you about the available options. We explain the capabilities of modern AA, the current advantages of simultaneous high specification ICP and introduce a new instrument solution which bridges the gap between these two established techniques. This will help you decide on the correct technology to meet your analytical demands, saving you time and money. Practical examples are provided with reference to mining, environmental, clinical and food analysis applications.

Who should attend?

• Laboratory Managers/Users who have a growing demand for trace elemental analysis
• Regular laboratory users of AA who need to increase productivity
• Analysts who require improved detection limits for trace elemental analysis
• New potential users to trace elemental or trace metals analysis

Register now >>>