Malvern, UK. February 22, 2010.

Specialists from Malvern Instruments will give papers and present posters on many different aspects of particle characterization at the Sixth World Congress on Particle Technology (WCPT6). The Congress, which takes place every four years, is being held from 26-29 April 2010 alongside POWTECH and TechnoPharm in Nürnberg, Germany. Malvern will also exhibit as part of Powtech, showing a number of systems across its materials characterization range, but with a particular focus on Insitec on-, at- and in-line particle size analyzers for process applications. These proven industrial systems are being used increasingly in many different industrial sectors as manufacturers strive to achieve greater process efficiency and lessen their impact on the environment.

Laser diffraction-based Insitec particle size analyzers from Malvern are designed specifically for use in the process setting. The real-time data they deliver transforms process control and enables manufacturers to confidently drive the plant towards optimal performance: better capital utilisation, lower energy consumption and reduced waste. Cement production, one of the most energy intensive industries in the world, is a clear example. In cement plants across the globe the installation of Insitec systems is driving down specific energy consumption, simultaneously improving product quality and consistency, enabling the greater use of cost-efficient, environmentally benign, replacement materials.

The six podium presentations from the Malvern team will cover a wide variety of topics including: a discussion of the links between rheology and particle parameters; particle characterization using automated image analysis; towards the optimum detector for wide dynamic range laser diffraction measurements; high concentration zeta potential measurement; dispersion of a metal powder; and spectroscopic approaches for the chemical analysis of tablets. Non-destructive evaluation of manufacturing process changes using near infrared chemical imaging is the subject of a poster presentation. Other posters cover nanoparticle measurement using dynamic light scattering, aspects of laser diffraction performance, and determining the particle size distribution of CeO.

For more details about Malvern's full range of materials characterization systems visit www.malvern.com.