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Bruker to Ring NASDAQ Opening Bell on Company's 50th Anniversary
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Agilent Technologies Awards 2010 Russell Varian Laureate for Excellence in Nuclear Magnetic Resonance Innovation
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JEOL AccuTOF-DART Mass Spectrometer Used in Georgia Institute of Technology's Newly-Developed Ovarian Cancer Test
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Bruker Announces Agreement to Acquire Veeco's Scanning Probe Microscopy (SPM) and Optical Industrial Metrology (OIM) Scientific Instruments Business
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Roenalytic Announces New XRF Service Representative for North America
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Rigaku NEX CG EDXRF Application Note: Chlorine & RoHS Elements In Polyethylene
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New Rigaku Desktop Alchemist liquid handling system delivers fast, cost-effective protein crystallization fine screen optimization
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Thermo Fisher Scientific Demonstrates Niton XL2 Series and Niton XL3t GOLDD Series XRF Alloy Analyzers at IMTS 2010
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PANalytical's Empyrean - the world of XRD analysis is no longer flat
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SPECTRO ARCOS recieves renowned award from Analytical Undustry in China
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PANalytical introduces the 3rd generation of industrial X-ray diffractometers
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PANalytical brings advanced XRF standardless analysis to the benchtop with Omnian and MiniPal 4
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Agilent Technologies Completes Acquisition of Varian, Inc., Marking Historic Milestone for Two Silicon Valley Pioneers
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Gordon F. Kirkbright Bursary Award, 2011
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Malvern ISys 5.0 cross-platform chemical imaging analysis software available to license
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New White Papers for SPECTRO xSORT Handheld-XRF
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Excillum and Bruker AXS Announce Collaboration to Develop X-ray Diffraction Solutions based on Novel Extremely Bright X-ray Sourc
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Bruker Announces New Scientific Instruments and Software, plus Innovative, Turn-Key Analyzers for the Pharma, Food, Solar, Metals and Advanced Materials Industries
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Bruker AXS Introduces the New D8 DISCOVER, an Advanced X-ray Diffraction System for Materials Research Applications Including 2-Dimensional Diffraction XRD2
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Bruker AXS Unveils Enhanced S2 RANGER EDXRF Spectrometer with Best-in-Class Light Element Analysis for the Food, Minerals & Mining and Cement Industries
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