Secondary Ion Mass Spectrometry: An Introduction to Principles and Practices

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Books

  • Published: Oct 17, 2014
  • Author: Paul van der Heide
  • ISBN: 978-1-118-48048-9
  • Format: Hardcover
  • Extent: 384 pages
  • Click here to buy the book
  • Channels: Base Peak
thumbnail image: Secondary Ion Mass Spectrometry: An Introduction to Principles and Practices

Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS)
• Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations
• Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission
• Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion SIMS)
• Details how data collection/processing can be carried out, with an emphasis placed on how to recognize and avoid commonly occurring analysis induced distortions
• Presented as concisely as believed possible with All sections prepared such that they can be read independently of each other

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