Effects of lithium insertion and deinsertion into V2O5 thin films: Optical, structural, and absorption properties

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EarlyView Article

  • Published: Oct 19, 2017
  • Author: R. Jourdani, L. Jadoual, M. Ait El Fqih, A. El Boujlaidi, H. Aouchiche, A. Kaddouri
  • Journal: Surface and Interface Analysis

The lithiated/delithiated vanadium pentoxide films deposited by sol‐gel spin coating on indium tin oxide–coated glass substrates were analyzed by sputter‐induced photon spectroscopy, X‐ray diffraction, and optical absorption techniques. First, it is shown that the crystalline structure of V2O5 after intercalation remains practically unchanged. Particularly, in the optical spectra during 5 keV Kr+ ion bombardment of clean, intercalated, and deintercalated V2O5 films, a series of sharp lines and unexpected continuum radiation were observed and well explained. It is also demonstrated that the intercalation and deintercalation of lithium have strong influences on various characteristics of pentoxide vanadium. The interpretations of the obtained results in the 3 experiments—X‐ray diffraction, sputter‐induced photon spectroscopy, and optical absorption techniques—are coherent and complement each other.

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