Surface and Interface Analysis

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  • Editor-in-Chief: John F. Watts
  • ISSN: 1066-9918
  • Channels: X-ray Spectrometry / Base Peak

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Surface and Interface Analysis is devoted to the publication of papers dealing with the development and application of techniques for the characterization of surfaces, interfaces and thin films. Papers dealing with standardization and quantification are particularly welcome, and also those which deal with the application of these techniques to industrial problems. Papers dealing with the purely theoretical aspects of the technique will also be considered. Review articles will be published; prior consultation with one of the Editors is advised in these cases. Papers must clearly be of scientific value in the field and will be submitted to two independent referees. Contributions must be in English and must not have been published elsewhere, and authors must agree not to communicate the same material for publication to any other journal.


Materials Scientists · Physicists · Physical Chemists · Scientists interested in Microelectronics, Organometallic Chemistry, Catalysis and Surface Analysis · Surface Engineers


SIA, surface analysis, interface analysis, thin-film, coating, adhesion, monolayer, microscopy, XPS, SIMS

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