JEOL PittCon product announcements

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  • Published: Mar 16, 2015
  • Author: Steve Down
  • Source: JEOL
  • Suppliers: JEOL
  • Channels: Sample Preparation / Gas Chromatography / Base Peak / NMR Knowledge Base

JEOL expanded its mass spectrometry, elemental analysis and electron microscopy product lines this year and showcased some of their newest technology to Pittcon 2015.

4th Generation GCxGC Mass Spectrometer with Powerful Data Analysis Software

The JEOL AccuTOF-GCx was exhibited for the first time in the U.S. at Pittcon 2015 in New Orleans. The AccuTOF-GCx, the fourth generation of JEOL's successful gas chromatography/time-of-flight mass spectrometer systems, is designed for optimum throughput, operation, and uptime. It offers improved resolution, accuracy, and sensitivity, while retaining the power and flexibility of the previous models. In combination with comprehensive 2D gas chromatography (GCxGC) using the Zoex thermal modulator, the GCx offers both powerful chromatographic separation and high-resolution mass spectra.

10yr Anniversary of DART celebrated with new AccuTOF-DART 4G

The 10th anniversary of the introduction of the enormously popular AccuTOF-DART® ambient ionization mass spectrometer was celebrated by introducing the new AccuTOF-DART®4G at Pittcon 2015, with new performance capabilities including enhanced resolution, speed, and accuracy in a rugged, flexible, versatile design. The AccuTOF-DART 4G couples the facile operation of the DART (Direct Analysis in Real Time) ion source with the high-resolution, accurate mass capability of the AccuTOF time-of-flight mass spectrometer. Not only can the user rapidly acquire data for mixtures and complete unknowns without sample carryover, but the resulting spectra yield unambiguous assignments, isotopic ratios and elemental compositions.

New EDXRF for Wide Range of Sample Types

JEOL has introduced an easy-to-use, smart solution for high-sensitivity elemental analysis in a new benchtop EDXRF spectrometer. The JSX-1000S ElementEye analyzes major to trace components on most sample types - solids, powders, and liquids - with little or no sample preparation.

The ElementEye complements SEM, EPMA, NMR, and mass spectrometry analyses, providing high-sensitivity qualitative and quantitative analysis results in minutes. A Thin Film FP method is optionally available for non-destructive measurement of film thickness on coated samples.

High-sensitivity analysis can be performed across the entire energy range using a maximum of 9 types of filters and a sample chamber vacuum unit. Features of the ElementEye include an optional 12-position auto sample changer; touch screen operation; pre-recorded recipes for standard solution applications - RoHS, Metals (Air/Vacuum), Oxides (Air/Vacuum), Organic Materials (Air/Vacuum) - high-sensitivity SDD and short-path optical system for high throughput analysis; and residual balance and thickness correction for organic samples.

Applications notes and more details can be found at

New NMR Spectrometer Series

JEOL exhibited the capabilities of the new JNM-ECZS series NMR, a next generation NMR spectrometer that incorporates ultra-high accuracy RF circuitry utilizing the latest digital high frequency technology. The compact spectrometer design features unprecedented levels of performance and expandability to support the most advanced NMR experiments.

The 43% reduction in size of the JNM-ECZS series compared to previous models simplifies NMR spectrometer placement in modern laboratories. Performance features critical to NMR data collection such as RF phase, frequency, and amplitude control, NMR pulse shape waveform data table size, and digital receiver performance have been improved by several orders of magnitude. These features collectively support the most advanced NMR experiments that combine a wide variety of NMR pulses in complicated NMR pulse sequences.

A complete set of high performance NMR probes are available for the JNM-ECZS spectrometer to support many NMR applications, including a new high sensitivity liquid-nitrogen probe capable of variable temperature experiments from -40 to 150°C. Combined with the new auto sample changers and auto tuning unit announced last year, the JNM-ECZS spectrometer system is capable of fully automated continuous operation from sample measurement to data processing.

JEOL began distribution of the JNM-ECZS in September 2014.

Console Replacement Offer to NMR Users

JEOL USA is pleased to announce a new program that, for a limited time, offers NMR users in the Americas the opportunity to replace their NMR consoles at a special price.

For more than 50 years, JEOL has been known for its legendary support. The company's wide range of NMR solutions are tailored to meet the needs of academic, industrial, and government customers whose applications range from routine experiments to advanced research.

JEOL has recently introduced an all-new ECZ-S and ECZ-R NMR Series, systems that incorporate the latest digital and high frequency technologies and offer both flexibility and expandability. With these new systems available, JEOL offers a special price for replacement of existing consoles from JEOL and other manufacturers, depending on magnet compatibility.

To learn how to improve the performance of their current NMR systems and enjoy JEOL USA support, users can submit a profile of their requirements to JEOL USA at

New Method for Trace Detection of Explosives from Fingerprints Uses Nanoextraction and Open Air Analysis

With the increased frequency in the use of improvised explosive devices (IEDs), there is a growing need for crime scene investigators to rapidly detect minute traces of explosive materials as well as link the devices to a person of interest. Whenever a latent fingerprint is found at the scene, most analytical techniques would involve use of a swab to take a sample, destroying the fingerprint in the process, however.

A new non-destructive method permits the detection of very small quantities of explosives without damaging valuable evidence. The method analyzes particles less than 20 microns in size extracted from a fingerprint by using a combination of nanoextraction and an optical microscope. These trace particles were then analyzed directly with the open-air, non-destructive AccuTOF-DART® time-of-flight mass spectrometer.

The technique is described in a new paper written by Clemons, K., J. Dake, et al. (U.S. Army Criminal Investigation Laboratory) "Trace analysis of energetic materials via direct analyte-probed nanoextraction coupled to direct analysis in real time mass spectrometry." Forensic Science International 231(1): 98-101.

"This new nanoextraction technique is very exciting because it allows very high precision analysis without destroying the fingerprint in any way," said Dr. Chip Cody of JEOL USA, who developed the unique capabilities of the first commercially-available open air mass spectrometer, DART®. "I'm impressed with the detection limits of 300 attograms the authors attained."

The JEOL AccuTOF-DART revolutionized mass spectrometry for direct analysis in real time without altering the sample in any way. Now being able to target specific particles for analysis is making the forensic scientist's work ever more precise. This same nanoextraction approach could also be used for other analytical techniques, including imaging with the Scanning Electron Microscope.

Copies of the paper are available through JEOL USA by contacting For more information on AccuTOF-DART, visit

About Jeol

JEOL is a world leader in electron optical equipment and instrumentation for high-end scientific and industrial research and development. Core product groups include electron microscopes (SEMs and TEMs), instruments for the semiconductor industry (electron beam lithography and a series of defect review and inspection tools), and analytical instruments including mass spectrometers, NMRs and ESRs.

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