Sample Analysis using Mapping

Wavelength dispersive XRF spectrometers are typically used for quantitative elemental analysis of many material types ranging from petrochemical, geochemical, metals, glass and ceramics, mining and cement. These samples are normally presented to the XRF instrument as uniform and homogenously prepared samples.

With the introduction of the Thermo Scientific ARL PERFORM’X spectrometer, a new dimension of sample analysis is now possible with sample surface mapping. The mapping capability enables heterogeneity, contamination, gradient, segregation and inclusion determination and analysis.

Read the full Application Note - AN41652 (PDF: 3.4 MB)