13th UK Annual LOT & J A Woollam Ellipsometry Seminar

The format of the day will include a short introduction in ellipsometry, to show the present status of applications and research.  With sample measurements we will demonstrate the power of the Woollam spectroscopic ellipsometers.

With the increasing need to characterise multilayer and multicompound systems in the last few years, the areas where Spectroscopic Ellipsometers are used is permanently growing.This technique allows very sensitive measurement of film thickness, optical constants, composition, surface and interface roughness and many more.  Nowadays, it is not only a tool for research and you will recognise an increase of applications close to production.  This requirement has been addressed by the development of several in-situ solutions for process monitoring and control.

During the seminar, besides presenting the well-established systems like VASE, M-2000, Apha-SE, we will also show the latest developments to address the requirements of photovoltaic applications and complex measurement and analysis - with graphene being a good example.  Systems will be available to demonstrate sample measurements.

There will be a complimentary lunch provided on the day as well as all day refreshments.  Delegates are encouraged to register as early as possible as places are limited.

Online Registration

For further details or to register please contact Angela Carslake, e-mail angela@lot-qd.co.uk or call +44 (0)1372 378822.  Alternatively, please use the online registration form.  The agenda will be finalised shortly.