Highest Resolution Confocal Raman – AFM – SNOM: New insights for Graphene and Nano-Materials
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Webinar
- Date: Oct 24, 2013 - 14:00 -
15:00 (local time)
- Presenter: Dr. Ute Schmidt & Dr. Thomas Dieing
- Categories: Raman
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Latest webinar
from WITec
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Highest Resolution Confocal Raman – AFM – SNOM:
New insights for Graphene and Nano-Materials
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Taking place on:
Thursday, 24 October 2013
15:00 BST | 16:00 CET | 10:00 EDT
Register now >>>
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The unique chemical, mechanical, electrical, and optical properties of graphene and other nano-materials require powerful and comprehensive characterization methods.
At the webinar you will learn how to set the benchmark in your field of application by applying state-of-the-art 3D confocal Raman, AFM and SNOM imaging for the simultaneous non-invasive analysis of such properties.
Along with various examples of applications this webinar will also introduce the operational principles of the various microscopic techniques, shedding light on the frontiers of spatial and spectral resolution.
Your presenters
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Dr Thomas Dieing
Director, Customer Support & Applications
WITec GmbH, Germany
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Dr Ute Schmidt
Applications Manager
WITec GmbH, Germany
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