Journal Highlight: Multielemental analysis of powder samples by direct measurement with TXRF

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  • Published: Aug 12, 2013
  • Author: spectroscopyNOW
  • Channels: X-ray Spectrometry
thumbnail image: Journal Highlight: Multielemental analysis of powder samples by direct measurement with TXRF
The ability of the method to perform quantitative multielemental analysis using total reflection X-ray fluorescence without sample digestion was demonstrated.


Multielemental analysis of powder samples by direct measurement with TXRF

X-Ray Spectrometry, 2013, 42, 213-219
C. Cantaluppi, M. Natali, F. Ceccotto, A. Fasson

Abstract: Total reflection X-ray fluorescence analysis was used to measure various powder samples directly put on an adhesive carbon tab placed on a quartz carrier. In this paper, the ability of the method to perform quantitative multielemental analysis without sample digestion was demonstrated. To assess the optimal measurement conditions, angular scans to find the best glancing angle were carried out, different kinds of reference standard powders were measured, and matrix effects and detection limits were evaluated. The results show a good agreement of data obtained with certified values. This quick method can be applied to characterize powders without any chemical treatment, thus reducing time for analysis and minimizing the risk of sample contamination. As a consequence, a great advantage is that a large number of samples can be analyzed in a short time: This method can be very useful in environmental applications such as the analysis of many atmospheric particulate samples from a wide area and for repeated monitoring.

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