Journal Highlight: High-quality quartz single crystals for high-energy-resolution inelastic X-ray scattering analyzers

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  • Published: Sep 9, 2013
  • Author: spectroscopyNOW
  • Channels: X-ray Spectrometry
thumbnail image: Journal Highlight: High-quality quartz single crystals for high-energy-resolution inelastic X-ray scattering analyzers
High-quality quartz crystals from a single block have been prepared and characterised for use as monochromators and spherical analyzers in X-ray scattering.

High-quality quartz single crystals for high-energy-resolution inelastic X-ray scattering analyzers

Journal of Applied Crystallography, 2013, 46, 939-944
Marcelo Goncalves Hönnicke, Xianrong Huang, Cesar Cusatis, Chaminda Nalaka Koditwuakku, Yong Q. Cai

Abstract: Spherical analyzers are well known instruments for inelastic X-ray scattering (IXS) experiments. High-resolution IXS experiments almost always use Si single crystals as monochromators and spherical analyzers. At higher energies (>20 keV) Si shows a high energy resolution (<10 meV), at an exact symmetric back-diffraction condition, since the energy resolution is given by the real part of the susceptibility or polarizability. However, at low energies (<10 keV), high energy resolution is difficult to achieve with Si. α-SiO2 (quartz) can be an option, since it offers high energy resolution at low energies. In this work, the characterization of high-quality α-SiO2 is presented. Such characterization is made by high-resolution rocking curve, topography and lattice parameter mapping in different samples from a single block. X-ray optics with α-SiO2 for IXS at lower energies (from 2.5 to 12.6 keV) with medium to high energy resolution (from 90 to 11 meV) are proposed and theoretically exploited.

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