Journal Highlight: Photon-in photon-out soft X-ray spectroscopy for materials science

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  • Published: Feb 7, 2011
  • Channels: X-ray Spectrometry
thumbnail image: Journal Highlight: Photon-in photon-out soft X-ray spectroscopy for materials science

Photon-in photon-out soft X-ray spectroscopy for materials science

physica status solidi (b) 2011, 248, 292-298
F. J. Himpsel

Abstract: A brief overview of the three elements of photon-in photon-out spectroscopy is given, i.e., X-ray absorption spectroscopy (XAS), X-ray emission spectroscopy (XES), and resonant inelastic X-ray scattering (RIXS). Key features are emphasized, such as element selectivity and the ability to study electronic states in dilute systems, at buried interfaces, and in a liquid environment. Characteristic applications in the areas of nanomaterials, biomaterials, and photovoltaic materials illustrate these capabilities.

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A brief overview is given of the three elements of photon-in photon-out spectroscopy: X-ray absorption spectroscopy, X-ray emission spectroscopy and resonant inelastic X-ray scattering.
Image: courtesy physica status solidi (b)
   

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