Correlative Raman Imaging and SEM (RISE Microscopy) - New Approaches in Chemical and Structural Analysis

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  • Date: May 15, 2018 - 14:00 (local time)
  • Presenter: Dr. Ute Schmidt and Dr. Fang Zhou
  • Categories: Raman
thumbnail image: Correlative Raman Imaging and SEM (RISE Microscopy) - New Approaches in Chemical and Structural Analysis

Correlative Raman Imaging and SEM (RISE Microscopy) - New Approaches in Chemical and Structural Analysis


Tuesday, May 15, 2018
8am PDT  |  11am EDT  |  4pm BST (UK)  |  5pm CEST

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Correlative microscopy is a hybrid approach that looks at a sample with different microscope technologies, each optimized individually then later linked for a far more detailed analysis of chemical and structural features. A new correlative method is RISE – Raman Imaging and Scanning Electron – microscopy. With this technique, information on the chemical composition of a sample provided by the optical Raman microscope is correlated with structural features imaged by a high resolution scanning electron microscope. The integration of both in one device eliminates the need to manually locate the same measurement position, a notoriously time-consuming process with separate instruments.

This webinar will focus on recent advances in RISE Microscopy, with a focus on the Sigma 300 RISE system. It uses a standard SEM port and an unmodified vacuum chamber while incorporating 3D Raman imaging and high resolution optical microscopy capabilities and preserving all standalone functionalities of the constituent instruments. The advantages of the correlative approach will be demonstrated, an overview of the hardware and software environment will be provided and example measurements will be presented.

Key learning objectives:

  • An introduction to the principles of Raman imaging and correlative microscopy
  • A description of the hardware and software integration of the ZEISS Sigma 300 RISE microscopy system
  • A brief overview of applications of RISE Microscopy with accompanying examples

Who should attend?

Raman spectroscopists, materials scientists, managers of multi-user microscopy facilities, electron microscopists

Your Presenters:

Dr. Ute Schmidt

Applications Manager

WITec GmbH, Ulm, Germany

Dr. Ute Schmidt: Biography

Ute Schmidt received a PhD in Physics from the University of Karlsruhe. After PostDoc positions there and at the North Carolina State University she was European Product Manager at Molecular Imaging Corp. Now she works as Applications Manager at WITec GmbH in Ulm, Germany.

Dr. Fang Zhou

Solution Manager, Business Sector Materials Science

Carl Zeiss Microscopy, Oberkochen, Germany

Dr. Fang Zhou: Biography

Fang Zhou is a solution Manager, Business Sector Materials Science, Carl Zeiss Microscopy. He received his PhD in Applied Physics from University of Tübingen. Previously, he received a B.S. from Zhejiang University in Hangzhou and a M.S. from Chinese Academy of Sciences in Beijing, China. Fang Zhou is highly experienced and has deep understanding in the area of low-kV SEM for surface sensitive imaging and precise metrology.

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